Abstract:
Electrical resistivity (ρ(T)) and magnetoresistivity (MR) measurements are presented for the (Ce1−xLax)Pt2Si2 alloy system. ρ(T) data at low temperatures for alloys in the concentrated Kondo lattice regime 0≤x≤0.2 conform to a ρ(T) = ρ0+AT2 dependence and Fermi-liquid parameters A and Tcoh are presented. The maximum that occurs in ρ(T) in the concentrated Kondo lattice regime at a temperature of Tmax is no longer observed for samples with x≥0.3 which show single-ion Kondo behaviour. MR measurements on alloys with x = 0.5, 0.7 and 0.9 yield values of the Kondo temperature TK through Schlottmann analysis. The dependences of A, Tmax and TK on x are discussed in terms of the volume and Kondo hole effects occurring upon alloying. Anomalies in ρ(T) for LaPt2Si2 and some of the alloy samples are also reported.
